Product Details

Microscopy Reference Standard 850 (Click to enlarge image) Cat.No. ASS-850
Product Name Microscopy Reference Standard 850
Description Pitch: 700 nm
Surface feature: Hardened photoresist ridges covered with Tungsten
Substrate: Silicon (3 x 4mm.
Line height: approximately 30 nm (not calibrated).
Line width: Approximately 130 nm (not calibrated).)
Mounting: Unmounted

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