Microscopy Reference Standard 844
Available from MatexcelProduct Details
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Cat.No. ASS-844
Product Name Microscopy Reference Standard 844
Description Pitch: 292 nm
Surface feature: Titanium lines
Substrate: Silicon (3 x 4mm.
Line height: approximately 30 nm (not calibrated).
Line width: Approximately 130 nm (not calibrated).)
Mounting: FEI 1506 Pin-Mounted
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Microscopy Reference Standard 844
