Microscopy Reference Standard 844

Available from Matexcel

Product Details

Microscopy Reference Standard 844 (Click to enlarge image) Cat.No. ASS-844
Product Name Microscopy Reference Standard 844
Description Pitch: 292 nm
Surface feature: Titanium lines
Substrate: Silicon (3 x 4mm.
Line height: approximately 30 nm (not calibrated).
Line width: Approximately 130 nm (not calibrated).)
Mounting: FEI 1506 Pin-Mounted

Rate and Review Matexcel - Microscopy Reference Standard 844

No reviews yet.

Let users know what you would have wanted to know about this company.