Microscopy Reference Standard 842

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Cat.No. ASS-842
Product Name Microscopy Reference Standard 842
Description Pitch: 292 nm
Surface feature: Titanium lines
Substrate: Silicon (3 x 4mm.
Line height: approximately 30 nm (not calibrated).
Line width: Approximately 130 nm (not calibrated).)
Mounting: Unmounted or mounted on 12 mm steel disks

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