Microscopy Reference Standard 814

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Cat.No. ASS-814
Product Name Microscopy Reference Standard 814
Description Pitch: 144nm
Surface feature: Aluminum bumps
Substrate: Silicon (4x3 mm die. Bump height (about 90 nm) and width (about 75 nm) are not calibrated.)
Mounting: Mounted on Topcon 15 mm round mounts, 10 mm high

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