Microscopy Reference Standard 754

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Cat.No. ASS-754
Product Name Microscopy Reference Standard 754
Description Pitch: 292nm
Surface feature: Titanium lines
Substrate: Silicon
Mounting: Pin Mounted (Head dia.=12.7mm; Pin dia.=3.2mm; Pin length= 7.9mm, FEI/Philips, Cambridge, Leica, TESCAN, CAMSCAN, ASPEX, Phenom

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